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Radar Level Measurement in High-Temperature and Pressure Applications

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Radar Level Measurement in High-Temperature and Pressure Applications

By Endress+Hauser

Radar Level Measurement in High-Temperature and Pressure Applications

By Endress+Hauser
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Radar technology in general has been introduced to the process industry as being a measurement technology using high-frequency electromagnetic waves that are not being influenced by the gas phase it travels through and the temperature and pressure conditions in process vessels.

As processes get more extreme in temperature and pressure it is time to have a closer look at radar behaviour in those critical applications and the solutions available on the market that overcome the obstacles.

Radar signals

All radar technologies available on the market that are used to measure level use the ‘Time-of -Flight’ principle. This means that the radar measurement device measures the elapsed time between emitting and receiving of a pulse consisting of a bundle of high-frequency electromagnetic waves. The frequency of the waves varies between 1GHz for guided wave devices and 6GHz and 26GHz for free space radars.

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