Nippon Chemi-Con has filed a patent for a control cuvette used in a measuring apparatus to ensure measurement accuracy. The cuvette has an observation pattern on its surface that represents the shape of a formed element in a liquid sample, allowing for precise observation. GlobalData’s report on Nippon Chemi-Con gives a 360-degree view of the company including its patenting strategy. Buy the report here.

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According to GlobalData’s company profile on Nippon Chemi-Con, Hydrogen storage alloys was a key innovation area identified from patents. Nippon Chemi-Con's grant share as of September 2023 was 28%. Grant share is based on the ratio of number of grants to total number of patents.

Control cuvette with observation pattern for measurement accuracy control

Source: United States Patent and Trademark Office (USPTO). Credit: Nippon Chemi-Con Corp

A recently filed patent (Publication Number: US20230314306A1) describes a control cuvette used for measurement accuracy control in a measuring apparatus. The control cuvette is designed to observe a formed element contained in a liquid sample after it has precipitated to the bottom surface of the cuvette.

One of the key features of the control cuvette is the presence of an observation pattern on the observation surface, which corresponds to the bottom surface of the cuvette. This observation pattern represents the shape of the formed element contained in the liquid sample. The observation pattern can be formed by irradiating light to a photosetting resin or a photodegradable resin applied to the observation surface.

The patent claims also specify that the observation pattern can represent the shape of the formed element contained in urine or blood. Additionally, it is mentioned that the control cuvette and the cuvette have the same shape in some of the claims.

Furthermore, the observation pattern is applied to the observation surface at a density corresponding to the observed density of the formed element in the liquid sample. This ensures that the control cuvette accurately reflects the density of the formed element, allowing for precise measurement accuracy control in the measuring apparatus.

In summary, the patent describes a control cuvette with an observation pattern that represents the shape of a formed element in a liquid sample. The observation pattern is applied at a density corresponding to the observed density of the formed element. This invention has potential applications in various fields where accurate measurement of formed elements in liquid samples is required, such as medical diagnostics and laboratory testing.

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GlobalData Patent Analytics tracks bibliographic data, legal events data, point in time patent ownerships, and backward and forward citations from global patenting offices. Textual analysis and official patent classifications are used to group patents into key thematic areas and link them to specific companies across the world’s largest industries.