Siemens has been granted a patent for a method to generate X-ray image datasets using a photon-counting X-ray detector with converter and pixel elements. The method involves counting signals in pixel elements based on incident X-ray radiation and generating datasets based on count and coincidence signals. GlobalData’s report on Siemens gives a 360-degree view of the company including its patenting strategy. Buy the report here.
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According to GlobalData’s company profile on Siemens, Smart factory applications was a key innovation area identified from patents. Siemens's grant share as of January 2024 was 56%. Grant share is based on the ratio of number of grants to total number of patents.
Method for generating x-ray image dataset using photon-counting detector
A recently granted patent (Publication Number: US11883216B2) discloses a method for generating an X-ray image dataset using a photon-counting X-ray detector with a converter and multiple pixel elements. The method involves counting both individual count signals and coincidence count signals in specific pixel elements based on X-ray radiation, with the coincidence count signals being determined by coincident electrical signals entering two different pixel elements. The X-ray image dataset is then generated based on these count signals and coincidence count signals, with additional steps for data preprocessing, image reconstruction, and postprocessing to enhance the quality of the final image.
Furthermore, the patent also covers an X-ray detector system incorporating the described method, along with a generating device to process the count signals and coincidence count signals for generating the X-ray image dataset. The system includes a converter, pixel elements, and comparators with adjustable energy thresholds to accurately count the signals. The method allows for adaptability in adjusting count signals in individual pixel elements based on coincidence count signals, leading to improved image quality. Additionally, the patent mentions the use of a trained function for generating the X-ray image dataset, with the coincidence count signals serving as input parameters for the function, showcasing a sophisticated approach to X-ray imaging technology.
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GlobalData Patent Analytics tracks bibliographic data, legal events data, point in time patent ownerships, and backward and forward citations from global patenting offices. Textual analysis and official patent classifications are used to group patents into key thematic areas and link them to specific companies across the world’s largest industries.
